Structure and optical properties of (Al2O3) x(Tio)1-x thin films prepared by a sol-gel processing

Vacuum

Volumn 76, Issue 2-3, 2004, Pages 215-218

  Vitanov, P ^a   Harizanova, A ^a   Angelov, Chr ^b   Petrov, I ^c   Alexieva, Z ^a   Stefanov, P ^d  

^a CTRL LAB SOLAR ENER NEW ENER S   (Bulgaria)

^b INSTITUTE FOR NUCLEAR RESEARCH AND NUCLEAR ENERGY   (Bulgaria)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d INSTITUTE OF GENERAL AND INORGANIC CHEMISTRY   (Bulgaria)

Author keywords

Al2O3; Metal oxides; Sol gel films; TiO2

Indexed keywords

ALUMINUM COMPOUNDS; ENERGY GAP; PERMITTIVITY; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOL-GELS; SPIN COATING; STOICHIOMETRY; STRUCTURE (COMPOSITION); TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

AL2O3; METAL OXIDES; SOL-GEL FILMS; TIO2;

THIN FILMS;

EID: 7044239177     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2004.07.017     Document Type: Conference Paper

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