Importance of low-angle grain boundaries in YBa2Cu 3O7-δ coated conductors

Superconductor Science and Technology

Volumn 22, Issue 1, 2009, Pages

  Durrell, J H ^a   Rutter, N A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL GROWTH; GRAIN SIZE AND SHAPE;

ANGLE BOUNDARIES; COATED CONDUCTORS; COLLECTIVE SYSTEMS; COMPREHENSIVE REVIEWS; GRAIN ALIGNMENTS; GRAIN BOUNDARY MISORIENTATION; MANUFACTURING TECHNIQUES;

GRAIN BOUNDARIES;

EID: 58249117861     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/22/1/013001     Document Type: Review

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