Control of meandering grain boundary configurations in YBa2Cu3Oy bicrystal thin films based on deposition rate

Journal of Materials Research

Volumn 11, Issue 10, 1996, Pages 2440-2449

  Zhang, X F ^a   Miller, D J ^a   Talvacchio, J ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b WESTINGHOUSE ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FILM GROWTH; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; NUCLEATION; OXIDE SUPERCONDUCTORS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES; YTTRIUM COMPOUNDS;

BICRYSTAL THIN FILMS; MEANDERING GRAIN BOUNDARY CONFIGURATIONS; THREE DIMENSIONAL ISLAND GROWTH; YTTRIUM BARIUM COPPER OXIDE;

SUPERCONDUCTING FILMS;

EID: 0030257397     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1996.0307     Document Type: Article

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