Comparative study of microstructural properties for YBa2Cu3O7 films on single-crystal and Ni-based metal substrates

Journal of Materials Research

Volumn 20, Issue 8, 2005, Pages 2055-2060

  Lin, Y ^a   Wang, H ^a   Maiorov, B ^a   Hawley, M E ^a   Wetteland, C J ^a   Arendt, P N ^a   Foltyn, S R ^a   Civale, L ^a   Jia, Q X ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); FILM GROWTH; ION BEAM ASSISTED DEPOSITION; MAGNESIA; NICKEL ALLOYS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SUBSTRATES; SUPERCONDUCTING FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

HIGH RESOLUTION X RAY DIFFRACTION (HRXRD); METAL SUBSTRATES; MICROSTRUCTURAL PROPERTIES;

YTTRIUM BARIUM COPPER OXIDES;

EID: 28844470436     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0252     Document Type: Article

References (20)

1. 7-x thin films deposited on polycrystalline metallic substrates. Appl. Phys. Lett. 60, 769 (1992).
2. 7-8 thick films on flexible buffered metallic substrates. Appl. Phys. Lett. 67, 2397 (1995).
3. 7 on biaxially textured nickel (001): An approach to superconducting tapes with high critical current density. Science 274, 755 (1996).
4. 7 films grown on polycrystalline metal alloy using a biaxially oriented MgO template. Appl. Phys. Lett. 81, 4571 (2002).
5. 7-δ coated conductors with near-single-crystal texture. Appl. Phys. Lett. 82, 4519 (2003).
6. J.R. Groves, P.N. Arendt, S.R. Foltyn, Q.X. Jia, T.G. Holesinger, H. Kung, R.F. DePaula, P.C. Dowden, E.J. Peterson, L. Stan, and L.A. Emmert: Recent progress in continuously processed IBAD MgO template meters for HTS applications. Physica C 382, 43 (2002).
7. P.N. Arendt and S.R. Foltyn: Biaxially textured IBAD-MgO templates for YBCO-coated conductors. MRS Bull. 29(8), 543 (2004).
8. 7-δ coated conductors. J. Mater. Res. 19, 1869 (2004).
9. 7-δ bicrystals. Phys. Rev. Lett. 61, 219 (1988).
10. G.K. Williamson and W.H. Hall: X-ray line broadening from filed aluminium and wolfram. Acta Metall. 1, 22 (1953).
11. T. Metzger, R. Hopler, E. Born, O. Ambacher, M. Stutzmann, R. Stommer, M. Schuster, H. Gobel, S. Christiansen, M. Albrecht, and H.P. Strunk: Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis x-ray diffractometry. Philos. Mag. A 77, 1013 (1998).
12. 4 substrates by ion-beam-assisted deposition and comparisons with ion-beam-assisted deposited yttria-stabilized-zirconia. Appl. Phys. Lett. 71, 2955 (1997).
13. 7 studied by scanning tunneling microscopy. Science 251, 1587 (1991).
14. c films. Nature 350, 279 (1991).
15. J. Narayan, P. Tiwari, X. Chen, J. Singh, R. Chowdhury, and T. Zheleva: Epitaxial growth of TiN films on (100) silicon substrates by laser physical vapor deposition. Appl. Phys. Lett. 61, 1290 (1992).
16. J. Narayan and B.C. Larsen: Domain epitaxy: A unified paradigm for thin film growth. J. Appl. Phys. 93, 278 (2003).
17. x thin films. Appl. Phys. Lett. 65, 776 (1994).
18. J.L. MacManus-Driscoll, S.R. Foltyn, Q.X. Jia, H. Wang, A. Serquis, B. Maiorov, L. Civale, Y. Lin, M.E. Hawley, M.P. Maley, and D.E. Peterson: Systematic enhancement of infield critical current density with rare earth ion size variance in superconducting rare earth barium cuprate films. Appl. Phys. Lett. 84, 5329 (2004).
19. 3. Nat. Mater. 3, 439 (2004).
20. 7 coated conductors and thin films. Appl. Phys. Lett. 84, 2121 (2004).