Modelling the V-I characteristic of coated conductors

Superconductor Science and Technology

Volumn 14, Issue 9, 2001, Pages 680-684

  Rutter, N A ^a   Glowacki, B A ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATED MATERIALS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; GRAIN BOUNDARIES; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY ANALYSIS;

COATED SUPERCONDUCTORS;

SUPERCONDUCTING TAPES;

EID: 0035445844     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/14/9/309     Document Type: Conference Paper

References (14)

1. Modelling of orientation relations in 2-D percolative systems of buffered metallic substrates for coated conductors