Microstructural and compositional analysis of YBa2Cu 3O7-δ films grown by MOCVD before and after GCIB smoothing

Physica C: Superconductivity and its Applications

Volumn 405, Issue 3-4, 2004, Pages 179-186

  Hatzistergos, M S ^a   Efstathiadis, H ^a   Reeves, J L ^b   Selvamanickam, V ^b   Allen, L P ^c   Lifshin, E ^a   Haldar, P ^a  

^a STATE UNIVERSITY OF NEW YORK   (United States)

^b SUPERPOWER INC   (United States)

^c Epion Corporation   (United States)

Author keywords

EDS; FIB; Gas cluster ion beam; Microstructure; MOCVD; SEM; XRD; YBCO

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRITICAL CURRENTS; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; ION BEAMS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

ION BEAM MICROSCOPY; LIQUID NITROGEN;

SUPERCONDUCTING FILMS;

EID: 2642583234     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.01.024     Document Type: Article

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