Direct experimental analysis of the relation between the grain structure and the distribution of critical current density in YBa2Cu 3Ox coated conductors

Superconductor Science and Technology

Volumn 18, Issue 3, 2005, Pages 299-306

  Van Der Laan, D C ^a   Dhalle M ^a   Naveira, L M ^b   Van Eck, H J N ^a   Metz, A ^a   Schwartz, J ^b,c   Davidson, M W ^b   Ten Haken, B ^a   Ten Kate, H H J ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b FLORIDA STATE UNIVERSITY   (United States)

^c FAMU FSU COLLEGE OF ENGINEERING   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; BARIUM; COPPER; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYOSTATS; CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARIES; MAGNETIC FIELD EFFECTS; YTTRIUM;

MAGNETIC KNIFE; MAGNETO-OPTICAL IMAGING; VERDET CONSTANT; WAVELENGTH;

SUPERCONDUCTING MATERIALS;

EID: 14844291363     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/3/016     Document Type: Article

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