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Volumn 15, Issue 5, 2000, Pages 1110-1119

The microstructure of continuously processed YBa2Cu3Oy coated conductors with underlying CeO2 and ion-beam-assisted yttria-stabilized zirconia buffer layers

(10) Holesinger, T G a Foltyn, S R a Arendt, P N a Kung, H a Jia, Q X a Dickerson, R M a Dowden, P C a DePaula, R F a Groves, J R a Coulter, J Y a

a LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENTS; CURRENT DENSITY; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; INTERFACES (MATERIALS); ION BEAM ASSISTED DEPOSITION; MICROSTRUCTURE; NUCLEATION; PASSIVATION; STRAIN; YTTRIUM BARIUM COPPER OXIDES;

COATED CONDUCTORS;

OXIDE SUPERCONDUCTORS;

EID: 0034190843 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2000.0158 Document Type: Article

Times cited : (52)

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