Simulation of the critical current density and its dependence on geometrical factors in RABiTS based coated conductors

Superconductor Science and Technology

Volumn 17, Issue 8, 2004, Pages 1003-1008

  Hanisch J ^a   Sarma, V S ^a   Zeimetz, B ^b   Schindler, F ^a   Eickemeyer, J ^a   Schultz, L ^a   Holzapfel, B ^a  

^a IFW DRESDEN   (Germany)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ASPECT RATIO; BACKSCATTERING; COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HEAT TREATMENT; SUPERCONDUCTING FILMS; TEXTURES;

COATED CONDUCTORS; ELECTRON BACKSCATTERING DIFFRACTION (EBSD); GEOMETRICAL FACTORS; GRAIN BOUNDARY NETWORK (GBN);

SUPERCONDUCTING MATERIALS;

EID: 4043075161     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/8/009     Document Type: Article

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