Structural and optical properties of nano-structured tungsten-doped ZnO thin films grown by pulsed laser deposition

Applied Surface Science

Volumn 255, Issue 7, 2009, Pages 4153-4158

  Ngom, B D ^a,b,c   Mpahane, T ^c   Manyala, N ^d   Nemraoui, O ^c   Buttner, U ^e   Kana, J B ^f   Fasasi, A Y ^g   Maaza, M ^a,c   Beye, A C ^a,b  

^a African Laser Centre   (South Africa)

^b UNIVERSITÉ CHEIKH ANTA DIOP   (Senegal)

^c MATERIALS RESEARCH GROUP   (South Africa)

^d NATIONAL UNIVERSITY OF LESOTHO   (Lesotho)

^e STELLENBOSCH UNIVERSITY   (South Africa)

^f Department of Physique University of Yaoundé 1 ^*  (Cameroon)

^g OBAFEMI AWOLOWO UNIVERSITY   (Nigeria)

Author keywords

Laser ablation; Nano structures; Optical windows; Semiconductor; Thin film

Indexed keywords

ENERGY GAP; II-VI SEMICONDUCTORS; LASER ABLATION; LIGHT TRANSMISSION; NANOSTRUCTURES; OPTICAL PROPERTIES; OXIDE FILMS; PULSED LASER DEPOSITION; PULSED LASERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR LASERS; SEMICONDUCTOR MATERIALS; SUBSTRATES; THIN FILMS; TUNGSTEN COMPOUNDS; WIDE BAND GAP SEMICONDUCTORS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE; ZINC SULFIDE;

C-AXIS-PREFERRED ORIENTATION; DOPED ZNO THIN FILMS; OPTICAL TRANSMISSION PROPERTY; OPTICAL WINDOW; OPTOELECTRONIC APPLICATIONS; STRUCTURAL AND OPTICAL PROPERTIES; WAVELENGTH REGIONS; X-RAY DIFFRACTION ANALYSES (XRD);

OPTICAL FILMS;

EID: 58149089957     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.10.122     Document Type: Article

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