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Volumn , Issue , 2008, Pages 210-213

Folded fully depleted Bulk+ technology as a highly w-scaled planar solution

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; MOSFET DEVICES; SILICON WAFERS;

EID: 58049101546     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2008.4681735     Document Type: Conference Paper
Times cited : (4)

References (14)
  • 1
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    • Design of ion-implanted MOSFET's with very small physical dimensions
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    • R.H. Dennard et al, "Design of ion-implanted MOSFET's with very small physical dimensions", IEEE Journal of Solid-State Circuits, v sc-9, n 5, pp 256-268, Oct. 1974.
    • (1974) IEEE Journal of Solid-State Circuits, v sc-9 , Issue.5 , pp. 256-268
    • Dennard, R.H.1
  • 2
    • 0347131289 scopus 로고    scopus 로고
    • Suppression of corner effects in triple-gate MOSFETs
    • Dec
    • J.G. Fossum et al, "Suppression of corner effects in triple-gate MOSFETs", IEEE Electron Device Letters, v 24, n 12, pp 745-747, Dec. 2003.
    • (2003) IEEE Electron Device Letters , vol.24 , Issue.12 , pp. 745-747
    • Fossum, J.G.1
  • 3
    • 0042888776 scopus 로고    scopus 로고
    • Threshold voltage and subthreshold slope of multiple-gate SOI MOSFETs
    • Aug
    • J.P. Colinge et al, "Threshold voltage and subthreshold slope of multiple-gate SOI MOSFETs", IEEE Electron Device Letters, v 24, n 8, pp 515-517, Aug. 2003.
    • (2003) IEEE Electron Device Letters , vol.24 , Issue.8 , pp. 515-517
    • Colinge, J.P.1
  • 4
    • 1442311898 scopus 로고    scopus 로고
    • Requirements for ultra-thin-film devices and new materials for the CMOS roadmap
    • June
    • C. Fenouillet-Beranger et al., "Requirements for ultra-thin-film devices and new materials for the CMOS roadmap", Solid-State Electronics, v 48, n 6, pp 961-967, June 2004.
    • (2004) Solid-State Electronics , vol.48 , Issue.6 , pp. 961-967
    • Fenouillet-Beranger, C.1
  • 5
    • 0033280988 scopus 로고    scopus 로고
    • SON (silicon on nothing)-a new device architecture for the ULSI era
    • M. Jurczak et al, "SON (silicon on nothing)-a new device architecture for the ULSI era", Digest of Symposium on VLSI Technology, pp 29-30, 1999.
    • (1999) Digest of Symposium on VLSI Technology , pp. 29-30
    • Jurczak, M.1
  • 6
    • 0035717576 scopus 로고    scopus 로고
    • First 80 nm SON (Silicon-On-Nothing) MOSFETs with perfect morphology and high electrical performance
    • S. Monfray et al., "First 80 nm SON (Silicon-On-Nothing) MOSFETs with perfect morphology and high electrical performance", Tech. Dig. of International Electron Devices Meeting, pp 645-648, 2001.
    • (2001) Tech. Dig. of International Electron Devices Meeting , pp. 645-648
    • Monfray, S.1
  • 7
    • 34547353067 scopus 로고    scopus 로고
    • 45 nm conventionnal Bulk and Bulk+ architectures for low-cost GP/LP applications
    • F. Boeuf et al., "45 nm conventionnal Bulk and Bulk+ architectures for low-cost GP/LP applications", Proc. of Int. Conf. on Solid State Devices and Materials, pp 28-29, 2005.
    • (2005) Proc. of Int. Conf. on Solid State Devices and Materials , pp. 28-29
    • Boeuf, F.1
  • 11
    • 76349095221 scopus 로고    scopus 로고
    • Facet Propagation in Si(Ge) Epitaxy or Etching
    • D. Dutartre et al., "Facet Propagation in Si(Ge) Epitaxy or Etching" , Proc. of ECS Cancun, 2006.
    • (2006) Proc. of ECS Cancun
    • Dutartre, D.1
  • 12
    • 34247214500 scopus 로고    scopus 로고
    • High-density plane deposition kinetics and facet propagation in silicon-selective epitaxial growth
    • N. Loubet et al., "High-density plane deposition kinetics and facet propagation in silicon-selective epitaxial growth", Semicond. Sci. Technol, n°22, pp. 149-152, 2007.
    • (2007) Semicond. Sci. Technol , Issue.N22 , pp. 149-152
    • Loubet, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.