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Volumn 93, Issue 23, 2008, Pages
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Measurement and evaluation of the interfacial thermal resistance between a metal and a dielectric
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINA;
CHROMIUM;
METALS;
PHONONS;
PHOTOGRAPHY;
PLASMA DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PLASMA FLOW;
PLASMAS;
PLATINUM;
PLATINUM METALS;
TITANIUM;
CROSS SECTIONS;
FILM STRUCTURES;
INTERFACIAL THERMAL RESISTANCES;
MEASURED VALUES;
METAL LAYERS;
NON EQUILIBRIUMS;
TWO-FLUID MODELS;
STRUCTURAL METALS;
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EID: 57649140334
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.3039806 Document Type: Article |
Times cited : (47)
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References (24)
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