Application of the three omega thermal conductivity measurement method to a film on a substrate of finite thickness

Journal of Applied Physics

Volumn 86, Issue 7, 1999, Pages 3959-3963

  Kim, Jung Hun ^a,b   Feldman, Albert ^a   Novotny, Donald ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000941763     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371314     Document Type: Article

References (11)

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