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Volumn 1, Issue 11, 2008, Pages 1170031-1170033

Optical properties of MoSi2/Si multilayer laue lens as nanometer X-ray focusing device

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; LENSES; MULTILAYERS; OPTICAL INSTRUMENTS; OPTICAL MATERIALS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; SILICON;

EID: 57649099008     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.1.117003     Document Type: Article
Times cited : (17)

References (17)
  • 4
    • 21244467150 scopus 로고    scopus 로고
    • Y. Suzuki, A. Takeuchi, H. Takano, and H. Takenaka: Jpn. J. Appl. Phys. 44 (2005) 1994.
    • Y. Suzuki, A. Takeuchi, H. Takano, and H. Takenaka: Jpn. J. Appl. Phys. 44 (2005) 1994.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.