Noninvasive leakage power tomography of integrated circuits by compressive sensing

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn , Issue , 2008, Pages 341-346

  Shamsi, Davood ^a   Boufounos, Petros ^a   Koushanfar, Farinaz ^b  

^a Rice University   (United States)

^b RICE UNIVERSITY   (United States)

Author keywords

Leakage current; Post silicon characterization; Process variations

Indexed keywords

FAST EXTRACTIONS; GATE LEAKAGES; LEAKAGE CURRENT; LEAKAGE POWER; LINEAR OPTIMIZATIONS; MULTIPLE INPUTS; POST-SILICON CHARACTERIZATION; PROCESS VARIATIONS; STATIC POWER;

CELLULAR RADIO SYSTEMS; DIAGNOSTIC RADIOGRAPHY; EXTRACTIVE METALLURGY; INTEGRATED CIRCUITS; LOW POWER ELECTRONICS; MEDICAL IMAGING; POWER ELECTRONICS; SIGNAL RECONSTRUCTION; TOMOGRAPHY;

LEAKAGE CURRENTS;

EID: 57549113706     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1393921.1394011     Document Type: Conference Paper

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