Input vector control for post-silicon leakage current minimization in the presence of manufacturing variability

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 606-609

  Alkabani, Yousra ^a   Massey, Tammara ^b   Koushanfar, Farinaz ^a,c   Potkonjak, Miodrag ^b  

^a Rice University

^b RICE UNIVERSITY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Input vector control; Low power; Manufacturing variability

Indexed keywords

INPUT VECTOR CONTROL; INPUT VECTORS; LOW POWER; MANUFACTURING VARIABILITY;

CMOS INTEGRATED CIRCUITS; COMBINATORIAL CIRCUITS; COMPUTER AIDED DESIGN; DESIGN; DIGITAL INTEGRATED CIRCUITS; INDUSTRIAL ENGINEERING; INTEGRATED CIRCUITS; SILICON;

VECTORS;

EID: 51549088218     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555889     Document Type: Conference Paper

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