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Volumn 11, Issue , 2003, Pages 136-151

Pitting and porous layer formation on n-InP anodes

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CYCLIC VOLTAMMETRY; IMAGE ANALYSIS; PITTING; POROUS MATERIALS; SILICON; SURFACE PHENOMENA; TRANSMISSION ELECTRON MICROSCOPY;

EID: 5744234980     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (28)
  • 24
    • 3042710584 scopus 로고    scopus 로고
    • E.B, Stokes, R.C. Fitch, D.N. Buckley, P.C. Chang, Y. Koide, R.F. Kopf, F. Ren, R.E. Sah, P.H. Shen, and D.M. Walker, Editors, PV 2003-04, The Electrochemical Society, Proceedings Series, Pennington, NJ
    • C. O'Dwyer, D. N. Buckley, D. Sutton and S. B. Newcomb, in Proceedings of the State-of-the-Art Program on Compound Semiconductors XXXVIII, E.B, Stokes, R.C. Fitch, D.N. Buckley, P.C. Chang, Y. Koide, R.F. Kopf, F. Ren, R.E. Sah, P.H. Shen, and D.M. Walker, Editors, PV 2003-04, p. 63, The Electrochemical Society, Proceedings Series, Pennington, NJ (2003)
    • (2003) Proceedings of the State-of-the-art Program on Compound Semiconductors XXXVIII , pp. 63
    • O'Dwyer, C.1    Buckley, D.N.2    Sutton, D.3    Newcomb, S.B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.