Blue electroluminescence from metal/oxide/6H-SiC tunneling diodes

IEEE Transactions on Electron Devices

Volumn 55, Issue 12, 2008, Pages 3590-3593

  Jan, Sun Rong ^a   Cheng, Tzu Huan ^b   Hung, Tzer An ^a   Kuo, Ping Sheng ^a   Liao, Ming Han ^a   Deng, Yu ^a   Liu, Chee Wee ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY   (Taiwan)

Author keywords

6H Silicon carbide (SiC); Electroluminescence (EL); Metal insulator semiconductor (MIS) light emitting diode (LED)

Indexed keywords

ADMINISTRATIVE DATA PROCESSING; DIODES; ELECTRIC FIELDS; ELECTROLUMINESCENCE; ELECTRON TRAPS; LIGHT; LIGHT EMISSION; LIGHT EMITTING DIODES; LIGHT SOURCES; LUMINESCENCE; METAL INSULATOR BOUNDARIES; MIS DEVICES; PLATINUM; SEMICONDUCTING SILICON; SEMICONDUCTOR DIODES; SILICON; SILICON CARBIDE; SWITCHING CIRCUITS; TUNNEL DIODES; TUNNELING (EXCAVATION);

6H-SILICON CARBIDE (SIC); BLUE ELECTROLUMINESCENCES; DAP TRANSITIONS; DRIVE CURRENTS; INJECT ELECTRONS; NEGATIVE GATES; ROOM TEMPERATURES; STRONG LUMINESCENCES; TUNNELING CURRENTS; TUNNELING DIODES;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 57149132667     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2006117     Document Type: Article

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