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Volumn 204, Issue 4, 2007, Pages 1147-1157

Laser-doping of silicon carbide for p-n junction and LED fabrication

Author keywords

[No Author keywords available]

Indexed keywords

LASER-DOPING; OPTICAL INTERFEROMETER PROFILOMETER SCAN; P-N JUNCTION;

EID: 34547163535     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200622466     Document Type: Conference Paper
Times cited : (10)

References (28)
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    • Z. Tian, Ph.D. Dissertation, University of Central Florida (Summer 2006).
    • (2006)
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  • 8
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    • S. Kamiyama, T. Maeda, Y. Nakamura, M. Iwaya, H. Amano, and I. Akasaki, J. Appl. Phys. 99, 93108-1-4 (2006).
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    • Lyle Patrick, J. Appl. Phys. 28(7), 765-776 (1957).
    • (1957) J. Appl. Phys , vol.28 , Issue.7 , pp. 765-776
    • Patrick, L.1
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    • S. I. Vlaskina, Quantum Electron. Opt. 5, 71-75 (2002).
    • S. I. Vlaskina, Quantum Electron. Opt. 5, 71-75 (2002).
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    • J. Edmond, H. Kong, A. Suvorov, D. Waltz, and C. Carter, Jr., phys. stat. sol. (a) 162, 481-491 (1997).
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    • Patent, 5416342 Cree Research, Inc, 16 May 1995
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    • Patent, 5243204 Sharp Kabushiki Kaisha, Osaka, Japan, 17 May 1991
    • A. Suzuki, K. Farukawa, and Y. Fujii, Patent # 5243204 (Sharp Kabushiki Kaisha, Osaka, Japan, 17 May 1991).
    • Suzuki, A.1    Farukawa, K.2    Fujii, Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.