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Volumn 27, Issue 12, 2008, Pages 2145-2155

Metal-density-driven placement for CMP variation and routability

Author keywords

Manufacturability; Physical design; Placement; VLSI

Indexed keywords

ANALYTICAL PLACEMENTS; CMP MODELS; DENSITY MAPS; DENSITY VARIATIONS; DUMMY FILLS; MANUFACTURABILITY; METAL DENSITIES; PHYSICAL DESIGN; PLACEMENT; PLACEMENT ALGORITHMS; PROBABILISTIC ROUTING; ROUTABILITY; VLSI; WIRE LENGTHS;

EID: 56749109565     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2008.2006148     Document Type: Conference Paper
Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.