Wire density driven global routing for CMP variation and timing

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2006, Pages 487-492

  Cho, Minsik ^a   Pan, David Z ^a   Xiang, Hua ^b   Puri, Ruchir ^b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Global routing; Manufacturability; Performance; VLSI

Indexed keywords

COMPUTER-AIDED DESIGN; DUMMY FILL; EXPERIMENTAL RESULTS; GLOBAL ROUTING; HOT-SPOTS; INTERNATIONAL CONFERENCES; NOVEL TECHNIQUES; ROUTABILITY; TIMING OPTIMIZATION; WIRE LENGTHS;

DESIGN; NANOTECHNOLOGY; ROUTING ALGORITHMS; TIME MEASUREMENT; WIRE;

GLOBAL OPTIMIZATION;

EID: 46149109870     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2006.320162     Document Type: Conference Paper

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