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Volumn 29, Issue 10, 2008, Pages 89-92

Study on mechanical properties and numerical simulation of fine pitch devices soldered joints

Author keywords

Fine pitch devices; Fracture microstructure; Nonlinear finite element; Reflow soldering

Indexed keywords

BRAZING; FLIP CHIP DEVICES; FRACTURE; FRACTURE TOUGHNESS; LEAD; MECHANICAL PROPERTIES; MECHANISMS; MICROSTRUCTURE; SOLDERED JOINTS; SOLDERING; WELDING;

EID: 55949133198     PISSN: 0253360X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (20)
  • 1
    • 33846603220 scopus 로고    scopus 로고
    • Thermo-fatigue life evaluation of SnAgCu solder joints in flip chip assemblies
    • Li X Y, Wang Z S. Thermo-fatigue life evaluation of SnAgCu solder joints in flip chip assemblies[J]. Journal of Materials Processing Technology, 2007, 183(1): 6-12.
    • (2007) Journal of Materials Processing Technology , vol.183 , Issue.1 , pp. 6-12
    • Li, X.Y.1    Wang, Z.S.2
  • 2
    • 0942299490 scopus 로고    scopus 로고
    • Properties of quad flat package joints using Sn-Zn-Bi solder with varying lead-plating materials
    • Iwanishi H, Hirose A, Imamura T, et al. Properties of quad flat package joints using Sn-Zn-Bi solder with varying lead-plating materials[J]. Journal of Electronic Materials, 2003, 12(32): 1540-1546.
    • (2003) Journal of Electronic Materials , vol.12 , Issue.32 , pp. 1540-1546
    • Iwanishi, H.1    Hirose, A.2    Imamura, T.3
  • 3
    • 34147219710 scopus 로고    scopus 로고
    • Effects of micro-amount of cerium on microstructures of SnAgCu solder and soldered joint
    • Han Zongjie, Xue Songbai, Liu Lin, et al. Effects of micro-amount of cerium on microstructures of SnAgCu solder and soldered joint[J]. Journal of Rare Earths, 2006, 24(S): 228-232.
    • (2006) Journal of Rare Earths , vol.24 , Issue.S , pp. 228-232
    • Han, Z.1    Xue, S.2    Liu, L.3
  • 4
    • 55949126517 scopus 로고    scopus 로고
    • Chinese source
  • 5
    • 48549086675 scopus 로고    scopus 로고
    • Numerical simulation of soldered joints and reliability analysis of PLCC components with J-shape leads
    • Zhang Liang, Xue Songbai, Lu Fangyan, et al. Numerical simulation of soldered joints and reliability analysis of PLCC components with J-shape leads[J]. China Welding, 2008, 17(2): 37-41.
    • (2008) China Welding , vol.17 , Issue.2 , pp. 37-41
    • Zhang, L.1    Xue, S.2    Lu, F.3
  • 6
    • 0037463944 scopus 로고    scopus 로고
    • Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
    • Kim K S, Huh S H, Suganuma K. Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints[J]. Journal of Alloys and Compounds, 2003, 352(1-2): 226-236.
    • (2003) Journal of Alloys and Compounds , vol.352 , Issue.1-2 , pp. 226-236
    • Kim, K.S.1    Huh, S.H.2    Suganuma, K.3
  • 7
    • 22944463330 scopus 로고    scopus 로고
    • Reliability of an 1657CCGA (ceramic column grid array) package with 95.5Sn3.9Ag0.6Cu lead-free solder paste on PCBs (printed circuit boards)
    • Lau J, Dauksher W. Reliability of an 1657CCGA (ceramic column grid array) package with 95.5Sn3.9Ag0.6Cu lead-free solder paste on PCBs (printed circuit boards)[J]. Journal of Electronic Packaging, 2005, 127(2): 96-105.
    • (2005) Journal of Electronic Packaging , vol.127 , Issue.2 , pp. 96-105
    • Lau, J.1    Dauksher, W.2
  • 8
    • 33846623357 scopus 로고    scopus 로고
    • Reliability of SnPb and Pb-free flip-chips under different test conditions
    • Spraul M, Nüchter W, Möller A, et al. Reliability of SnPb and Pb-free flip-chips under different test conditions[J]. Microelectronics Reliability. 2007, 47(2-3): 252-258.
    • (2007) Microelectronics Reliability , vol.47 , Issue.2-3 , pp. 252-258
    • Spraul, M.1    Nüchter, W.2    Möller, A.3
  • 9
    • 0038689228 scopus 로고    scopus 로고
    • Fatigue life models for SnAgCu and SnPb solder joints evaluated by experiments and simulation
    • New Orleans, US
    • Schubert A, Dudek R, Auerswald E, et al. Fatigue life models for SnAgCu and SnPb solder joints evaluated by experiments and simulation[C]//Electronic Components and Technology Conference, New Orleans, US, 2003: 603-610.
    • (2003) Electronic Components and Technology Conference , pp. 603-610
    • Schubert, A.1    Dudek, R.2    Auerswald, E.3
  • 10
    • 0035501302 scopus 로고    scopus 로고
    • Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints
    • Stam F A, Davitt E. Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints[J]. Microelectronics Reliability, 2001, 41(11): 1815-1822.
    • (2001) Microelectronics Reliability , vol.41 , Issue.11 , pp. 1815-1822
    • Stam, F.A.1    Davitt, E.2
  • 11
  • 13
    • 55949122593 scopus 로고    scopus 로고
    • Chinese source
  • 15
    • 0040748904 scopus 로고    scopus 로고
    • Applying and model to represent the viscoplastic deformation behavior solder alloys
    • Wang G Z, Cheng Z N, Becker K, et al. Applying and model to represent the viscoplastic deformation behavior solder alloys[J]. Journal of Electronic Packaging, 2001, 123(3): 127-253.
    • (2001) Journal of Electronic Packaging , vol.123 , Issue.3 , pp. 127-253
    • Wang, G.Z.1    Cheng, Z.N.2    Becker, K.3
  • 16
    • 55949092766 scopus 로고    scopus 로고
    • Chinese source
  • 17
    • 33645144815 scopus 로고    scopus 로고
    • Finite element modeling predicts the effects of voids on thermal shack reliability and thermal resistance of power device
    • Chang B J, Dirk W J, Xie A X. Finite element modeling predicts the effects of voids on thermal shack reliability and thermal resistance of power device[J]. Welding Research, 2006, 85(S): 63-70.
    • (2006) Welding Research , vol.85 , Issue.S , pp. 63-70
    • Chang, B.J.1    Dirk, W.J.2    Xie, A.X.3
  • 18
    • 38749130065 scopus 로고    scopus 로고
    • Shorter field life power cycling for organic packages
    • Park S B, Ahmed I Z. Shorter field life power cycling for organic packages[J]. Journal of Electronic Packaging, 2007, 129(1): 28-34.
    • (2007) Journal of Electronic Packaging , vol.129 , Issue.1 , pp. 28-34
    • Park, S.B.1    Ahmed, I.Z.2
  • 19
    • 55949113729 scopus 로고    scopus 로고
    • Chinese source
  • 20
    • 55949116832 scopus 로고    scopus 로고
    • Chinese source


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.