Feedback based simultaneous correction of imaging artifacts due to geometrical and mechanical cross-talk and tip-sample stick in atomic force microscopy

Review of Scientific Instruments

Volumn 78, Issue 10, 2007, Pages

  Shegaonkar, Ajit C ^a   Salapaka, Srinivasa M ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FEEDBACK; GEOMETRY; OPTICAL BEAM SPLITTERS; OPTICAL RESOLVING POWER;

CANTILEVER GEOMETRY; PHOTOSENSOR; PIEZOASSEMBLY;

IMAGING SYSTEMS;

ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; COMPUTER ASSISTED DIAGNOSIS; EQUIPMENT; EQUIPMENT DESIGN; FEEDBACK SYSTEM; IMAGE ENHANCEMENT; INSTRUMENTATION; MECHANICS; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ARTIFACTS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FEEDBACK; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MECHANICS; MICROSCOPY, ATOMIC FORCE; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 36048987391     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2800783     Document Type: Article

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