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Review of Scientific Instruments

Volumn 79, Issue 10, 2008, Pages

Development of UHV dynamic nanostencil for surface patterning

(5) Guo, Haiming a Martrou, David a Zambelli, Tomaso a Dujardin, Erik a Gauthier, Śbastien a

a CEMES CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROELECTRODES; MICROSCOPIC EXAMINATION; MOLECULAR ELECTRONICS; VACUUM;

ATOMIC FORCES; IN SITU AFM; NANOMETER PRECISIONS; NANOPATTERNING; NANOSCALE STRUCTURES; NANOSTENCIL; SCANNING RANGES; STATIC AND DYNAMICS; TECHNICAL PROBLEMS; ULTRAHIGH VACUUM ENVIRONMENTS;

ULTRAHIGH VACUUM;

EID: 55349106554 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.2999547 Document Type: Conference Paper

Times cited : (9)

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