A metallic microcantilever electric contact probe array incorporated in an atomic force microscope

Review of Scientific Instruments

Volumn 71, Issue 5, 2000, Pages 2087-2093

  Ondarcuhu T ^a   Nicu, L ^b   Cholet, S ^a   Bergaud, C ^b   Gerdes, S ^a   Joachim, C ^a  

^a CEMES CNRS   (France)

^b LAAS CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000682617     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150584     Document Type: Article

References (14)

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