Investigation of capacitance transients in CuInS2 due to ionic migration

Solar Energy Materials and Solar Cells

Volumn 92, Issue 12, 2008, Pages 1579-1585

  Loef, Ruben ^a   Schoonman, Joop ^a   Goossens, Albert ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

CuInS2 TID; DLTS; Self healing

Indexed keywords

CHEMICAL ACTIVATION; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEFECTS; IONIC CONDUCTION; IONS; THIN FILM DEVICES;

CAPACITANCE TRANSIENT; CUINS2 TID; DEEP ELECTRONIC STATE; DEPLETION REGION; GOUY-CHAPMAN THEORY; RECOMBINATION CENTERS; SELF-HEALING; SELF-HEALING PROPERTIES;

ACTIVATION ENERGY;

EID: 55349092316     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2008.07.005     Document Type: Article

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