Direct evidence for diffusion and electromigration of Cu in CuInSe2

Journal of Applied Physics

Volumn 82, Issue 9, 1997, Pages 4282-4285

  Gartsman, Konstantin ^a   Chernyak, Leonid ^a   Lyahovitskaya, Vera ^a   Cahen, David ^a   Didik, Vladimir ^b   Kozlovsky, Vitaliy ^b   Malkovich, Roald ^b   Skoryatina, Elena ^b   Usacheva, Valentina ^b  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000493087     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366252     Document Type: Article

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