Depth profile of the lattice constant of the Cu-poor surface layer in (Cu2Se)1 - x(In2Se3)x evidenced by grazing incidence X-ray diffraction

Journal of Physics and Chemistry of Solids

Volumn 64, Issue 9-10, 2003, Pages 1559-1563

  Kotschau I M ^a   Schock, H W ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

C. X ray diffraction

Indexed keywords

LATTICE CONSTANTS; PHOTOVOLTAIC EFFECTS; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE;

COPPER COMPOUNDS;

EID: 0042737990     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(03)00074-X     Document Type: Conference Paper

References (14)

1. Niemegeers A., Burgelman M., Herberholz R., Rau U., Hariskos D., Schock H.W. Prog. Photovolt. Res. Appl. 6:1998;407.
2. Rau U., Weinert K., Nguyen Q., Mamor M., Hanna G., Jasenek A., Schock H.W. Mat. Res. Soc. Symp. Proc. 668:2001.
3. Schmid D., Ruckh M., Grunwald F., Schock H.W. J. Appl. Phys. 73:1993;2902.
4. Herberholz R., Rau U., Schock H.W., Halboom T., Gödecke T., Ernst F., Beilharz C., Benz K.W., Cahen D. Eur. Phys. J. Appl. Phys. 6:1999;131.
5. I.M. Kötschau, PhD-Thesis, Universität Stuttgart, Stuttgart, 2002.
6. Suri D.K., Nagpal K.C., Chadha G.K. J. Appl. Cryst. 22:1989;578.
7. S.A. López-Rivera, B. Fontal, J.A. Henao, E. Mora, W. Giriat, R. Vargas, Proceedings of 11th International Conference on Ternary an Multinary Compounds, Salford, 1997, Inst. Phys. Conf. Ser., IOP Bristol, pp. 175.
8. Nadenau V., Braunger D., Hariskos D., Kaiser M., Köble C., Oberacker A., Ruckh M., Rühle U., Schäffler R., Schmid D., Walter T., Zweigart S., Schock H.W. Prog. Photovolt. Res. Appl. 3:1995;363.
9. Gabor A.M., Tuttle J.R., Bode M.H., Franz A., Tennant A.L., Contreras M.A., Noufi R., Jensen D.G., Hermann A.M. Sol. Energy Mater. Sol. Cells. 41:1996;247.
10. Takayama T., Matsumoto Y. Barrett C.S. Advances in X-Ray Analysis. 1990;Plenum Press, New York.
11. Lim G., Parrish W., Ortiz C., Bellotto M., Hart M. J. Mater. Res. 2:1987;471.
12. Ballard B.L., Zhu X., Predecki P.K., Albin D., Gabor A., Tuttle J., Noufi R. Adv. X-Ray Anal. 38:1995;269.
13. Predecki P. Powder Diffr. 8:1993;122.
14. Young R.A. Young R.A. IUCr Monographs on Crystallography. 1995;Oxford University Press, Oxford.