Microstructure of surface layers in Cu(In,Ga)Se2 thin films

Applied Physics Letters

Volumn 81, Issue 6, 2002, Pages 1008-1010

  Yan, Y ^a   Jones, K M ^a   Abushama, J ^a   Young, M ^a   Asher, S ^a   Al Jassim, M M ^a   Noufi, R ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; CONVERGENT-BEAM ELECTRON DIFFRACTION; CU(IN , GA)SE; DEFECT CHALCOPYRITE STRUCTURE; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; HOMO-JUNCTIONS; SUB-INTERFACES; SURFACE LAYERS; SURFACE REGION;

COPPER COMPOUNDS; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; GALLIUM; MICROSTRUCTURE; POINT DEFECTS; SEMICONDUCTING SELENIUM COMPOUNDS; SURFACE DEFECTS; THIN FILMS;

COPPER;

EID: 79956034767     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1498499     Document Type: Article

References (15)

1. M. A. Contreras, B. Egaas, K. Ramanathan, J. Hiltner, A. Swartzlander, F. Hasoon, and R. Noufi, Prog. Photovoltaics 7, 311 (1999). proPPHOED1062-7995
2. U. C. Boehnke and G. Kuhn, J. Mater. Sci. 22, 1635 (1987). jmtJMTSAS0022-2461
3. S. Nishiwaki, T. Satoh, S. Hayashi, Y. Hashimoto, T. Negami, and T. Wada, J. Mater. Res. 14, 4514 (1999). jmrJMREEE0884-2914
4. J. S. Park, Z. Dong, S. Kim, and J. H. Perepesko, J. Appl. Phys. 87, 3683 (2000). japJAPIAU0021-8979
5. R. Noufi, R. Axton, and C. Herrington, Appl. Phys. Lett. 45, 668 (1984). aplAPPLAB0003-6951
6. J. Kessler, J. Scholdstrom, and L. Stolt, Proceedings of the 28th IEEE Photovoltaic Specialists Conference, Anchorage, AK, Sept. 2000, p. 509.
7. F. S. Hasoon, Y. Yan, K. M. Jones, H. Althani, J. Alleman, M. M. Al-Jassim, and R. Noufi, Proceedings of the 28th IEEE Photovoltaic Specialists Conference, Anchorage, AK, Sept. 2000, p. 513.
8. D. Schmid, M. Ruckh, F. Grunwald, and H. W. Schock, J. Appl. Phys. 73, 2902 (1993). japJAPIAU0021-8979
9. T. Negami, N. Kohara, M. Nishitani, and T. Wada, Jpn. J. Appl. Phys., Part 2 33, L1251 (1994). jjcJAPLD80021-4922
10. T. Walter, R. Herberholz, C. Muller, and H. W. Schock, J. Appl. Phys. 80, 4411 (1996). japJAPIAU0021-8979
11. Y. Yan, K. M. Jones, J. AbuShama, M. M. Al-Jassim, and R. Noufi, Mater. Res. Soc. Symp. Proc. 668, H6.10.1 (2001). mrsMRSPDH0272-9172
12. B. H. Tseng and C. A. Wert, J. Appl. Phys. 65, 2254 (1989). japJAPIAU0021-8979
13. H. Z. Xiao, L.-C. Yang, and A. Rockett, J. Appl. Phys. 76, 1503 (1994). japJAPIAU0021-8979
14. M. Hornung, K. W. Benz, L. Margulis, D. Schmid, and H. W. Schock, J. Cryst. Growth 154, 315 (1995). jcrJCRGAE0022-0248
15. D. S. Su, W. Neumann, R. Hunger, P. Schubert-Bischoff, M. Gieysig, H. J. Lewerenz, R. Scheer, and E. Zeitler, Appl. Phys. Lett. 73, 785 (1998). aplAPPLAB0003-6951