Raman and PL study of defect-ordering in CuInS2 thin films

Thin Solid Films

Volumn 451-452, Issue , 2004, Pages 193-197

  Nanu, Marian ^a   Schoonman, Joop ^a   Goossens, Albert ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

CuInS2; Extrinsic defects; Photoluminescence; Raman spectroscopy

Indexed keywords

CHARGE COUPLED DEVICES; COPPER COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL LATTICES; ELECTRON ENERGY LEVELS; ENERGY GAP; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

EXTRINSIC DEFECTS; PHOTOLUMINESCENCE SPECTROSCOPY;

THIN FILMS;

EID: 17644440268     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.118     Document Type: Conference Paper

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