Experimental evidence of a gaussian roughness at Si(111)/SiO2 interfaces

Physical Review Letters

Volumn 81, Issue 22, 1998, Pages 4919-4922

  Chen, Xidong ^a   Gibson, J M ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3843052729     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.81.4919     Document Type: Article

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