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Volumn 54, Issue 2, 1998, Pages 232-239

On the Extendibility of X-ray Crystallography to Noncrystals

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[No Author keywords available]

Indexed keywords


EID: 0542373689     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767397015572     Document Type: Article
Times cited : (70)

References (25)
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    • 0542447058 scopus 로고
    • edited by D. Sayre, M. Howells, J. Kirz & H. Rarback
    • Guttmann, G. D., Henke, B. L. & Kerner, J. A. (1988). X-ray Microscopy II, edited by D. Sayre, M. Howells, J. Kirz & H. Rarback, pp. 151-153. Springer Series in Optical Sciences, Vol. 56. Berlin: Springer.
    • (1988) X-ray Microscopy II , pp. 151-153
    • Guttmann, G.D.1    Henke, B.L.2    Kerner, J.A.3
  • 6
    • 0542375672 scopus 로고    scopus 로고
    • Berlin: Springer
    • Guttmann, G. D., Henke, B. L. & Kerner, J. A. (1988). X-ray Microscopy II, edited by D. Sayre, M. Howells, J. Kirz & H. Rarback, pp. 151-153. Springer Series in Optical Sciences, Vol. 56. Berlin: Springer.
    • Springer Series in Optical Sciences , vol.56
  • 14
    • 0002392403 scopus 로고
    • edited by M. Schlenker, M. Fimk, J. P. Goedgebuer, C. Malgrange, J. Ch. Viénot & R. H. Wade
    • Sayre, D. (1980). Imaging Processes and Coherence in Physics, edited by M. Schlenker, M. Fimk, J. P. Goedgebuer, C. Malgrange, J. Ch. Viénot & R. H. Wade, pp. 229-235. Lecture Notes in Physics, Vol. 112. Berlin: Springer.
    • (1980) Imaging Processes and Coherence in Physics , pp. 229-235
    • Sayre, D.1
  • 15
    • 0003464004 scopus 로고    scopus 로고
    • Berlin: Springer
    • Sayre, D. (1980). Imaging Processes and Coherence in Physics, edited by M. Schlenker, M. Fimk, J. P. Goedgebuer, C. Malgrange, J. Ch. Viénot & R. H. Wade, pp. 229-235. Lecture Notes in Physics, Vol. 112. Berlin: Springer.
    • Lecture Notes in Physics , vol.112
  • 17
    • 0010809181 scopus 로고    scopus 로고
    • New York: Plenum
    • Sayre, D. (1991). Direct Methods of Solving Crystal Structures, edited by H. Schenk, pp. 353-356. NATO ASI Series B (Physics), Vol. 274. New York: Plenum.
    • NATO ASI Series B (Physics) , vol.274
  • 18
    • 84977298609 scopus 로고
    • erratum: (1995), A51, 810
    • Sayre, D. & Chapman, H. N. (1995). Acta Cryst. A51, 237-252; erratum: (1995), A51, 810.
    • (1995) Acta Cryst. , vol.A51 , pp. 237-252
    • Sayre, D.1    Chapman, H.N.2
  • 19
    • 0039524135 scopus 로고
    • edited by G. Schmahl & D. Rudolph
    • Sayre, D., Haelbich, R. P., Kirz, J. & Yun, W. B. (1984). X-ray Microscopy, edited by G. Schmahl & D. Rudolph, pp. 314-316. Springer Series in Optical Sciences, Vol. 43. Berlin: Springer.
    • (1984) X-ray Microscopy , pp. 314-316
    • Sayre, D.1    Haelbich, R.P.2    Kirz, J.3    Yun, W.B.4
  • 20
    • 0542375672 scopus 로고    scopus 로고
    • Berlin: Springer
    • Sayre, D., Haelbich, R. P., Kirz, J. & Yun, W. B. (1984). X-ray Microscopy, edited by G. Schmahl & D. Rudolph, pp. 314-316. Springer Series in Optical Sciences, Vol. 43. Berlin: Springer.
    • Springer Series in Optical Sciences , vol.43
  • 21
    • 85034470422 scopus 로고
    • edited by D. Sayre, M. Howells, J. Kirz & H. Rarback
    • Sayre, D., Yun, W. B. & Kirz, J. (1988). X-ray Microscopy II, edited by D. Sayre, M. Howells, J. Kirz & H. Rarback, pp. 272-275. Springer Series in Optical Sciences, Vol. 56. Berlin: Springer.
    • (1988) X-ray Microscopy II , pp. 272-275
    • Sayre, D.1    Yun, W.B.2    Kirz, J.3
  • 22
    • 0542375672 scopus 로고    scopus 로고
    • Berlin: Springer
    • Sayre, D., Yun, W. B. & Kirz, J. (1988). X-ray Microscopy II, edited by D. Sayre, M. Howells, J. Kirz & H. Rarback, pp. 272-275. Springer Series in Optical Sciences, Vol. 56. Berlin: Springer.
    • Springer Series in Optical Sciences , vol.56


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.