Atomic resolution transmission electron microscopy of surfaces

Journal of Materials Research

Volumn 20, Issue 7, 2005, Pages 1619-1627

  Chiaramonti, Ann N ^a   Marks, Laurence D ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; DATA ACQUISITION; IMAGE PROCESSING; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

ATOMIC RESOLUTION; SURFACE CRYSTAL;

SURFACE STRUCTURE;

EID: 29044444846     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0211     Document Type: Review

References (45)

1. Y.W. Chung: Practical Guide to Surface Science and Spectroscopy (Academic Press, San Diego, CA, 2001).
2. J. Venables, D.J. Smith, and J.M. Cowley: HREM, STEM, REM, SEM and STM. Surf Sci. 181, 235 (1987).
3. J.M. Cowley: Electron microscopy of surface structure. Prog. Surf Sci. 21, 209 (1986).
4. G. Jayaram, R. Plass, and L.D. Marks: UHV-HREM and diffraction of surfaces. Interface Sci. 2, 379 (1995).
5. A. Subramanian and L.D. Marks: Surface crystallography via electron microscopy. Ultramicroscopy 98, 151 (2004).
6. A. Subramanian and L.D. Marks: Direct observation of charge transfer at a MgO(111) surface. Phys. Rev. Lett. 92, 26101 (2004).
7. E.D. Boyes and P.L. Gai: Environmental high resolution electron microscopy and applications to chemical science. Ultramicroscopy 67, 219 (1997).
8. R. Sharma: Design and applications of environmental cell transmission electron microscope for In Situ observations of gas-solid reactions. Microsc. Microanal. 7, 494 (2001).
9. M. Haider, S. Uhlemann, E. Schwan, H. Rose, B. Kabius, and K. Urban: Electron microscopy image enhanced. Nature 392, 768 (1998).
10. H. Poppa: High resolution, high speed ultrahigh vacuum microscopy. J. Vac. Sci. Technol. A 22, 1931 (2004).
11. D. Olynick, J.M. Gibson, and R. Averback: In situ ultra-high vacuum transmission electron microscopy studies of nanocrystalline copper. Mater. Sci. Eng. A 204, 54 (1995).
12. R.M. Tromp and F.M. Ross: Advances in in situ ultra-high vacuum electron microscopy: Growth of SiGe on Si. Ann. Rev. Mater. Sci. 30, 431 (2000).
13. C. Collazo-Davila, E. Landree, D. Grozea, G. Jayaram, R. Plass, P.C. Stair, and L.D. Marks: Design and initial performance of an ultrahigh vacuum sample preparation evaluation analysis and reaction (SPEAR) system. JMSA 1, 267 (1995).
14. P. Xu, G. Jayaram, and L.D. Marks: Cross-correlation method for intensity measurement of transmission electron-diffraction patterns. Ultramicroscopy 53, 15 (1994).
15. E. Landree, C. Collazo-Davila, and L.D. Marks: Multi-solution genetic algorithm approach to surface structure determination using direct methods. Acta Crystallogr. B53, 916 (1997).
16. L.D. Marks, E. Bengu, C. Collazo-Davila, D. Grozea, E. Landree, C. Leslie, and W. Sinkler: Direct methods for surfaces. Surf Rev. Lett. 5, 1087 (1998).
17. K. Yagi, K. Takayanagi, K. Kobayashi, N. Osakabe, Y. Tanishiro, and G. Honjo: Surface study by an UHV electron microscope. Surf Sci. 86, 174 (1979).
18. K. Takayanagi, Y. Tanishiro, M. Takahashi, and S. Takahashi: Structural analysis of silicon(111)-7 × 7 by UHV-transmission electron diffraction and microscopy. J. Vac. Sci. Technol. A 3, 1502 (1985).
19. K. Takayanagi, Y. Tanishiro, S. Takahshi, and M. Takahashi: Structure analysis of silicon(111)-7 × 7 reconstructed surface by transmission electron diffraction. Surf Sci. 164, 367 (1985).
20. C. Collazo-Davila, L.D. Marks, K. Nishi, and Y. Tanishiro: Atomic structure of the In on Si(111)(4 x 1) surface. Surf Rev. Lett. 4, 65 (1997).
21. L.D. Marks and R. Plass: Atomic structure of Si(111)-(5 × 2)-Au from high resolution electron microscopy and heavy-atom holography. Phys. Rev. Lett. 75, 2172 (1995).
22. D. Grozea, E. Landree, L.D. Marks, R. Feidenhansl, M. Nielsen, and R.L. Johnson: Direct methods determination of the Si(111)- (6 × 6)Au surface structure. Surf Sci. 418, 32 (1998).
23. N. Erdman, K.R. Poeppelmeier, M. Asta, O. Warschkow, D.E. Ellis, and L.D. Marks: The structure and chemisty of the TiO2-rich surface of SrTiO3(001). Nature 419, 55 (2002).
24. D. Cherns: Direct resolution of the surface atomic steps by transmission electron microscopy. Philos. Mag. 30, 549 (1974).
25. J.W. Edington: Electron Diffraction in the Electron Microscope (The Macmillan Press, London, U.K., 1974).
26. G. Lehmpfuhl and C.E. Warble: Direct electron microscopic imaging of surface topography by diffraction and phase contrast. Ultramicroscopy 19, 135 (1986).
27. J.P. Zhang (unpublished, 1989).
28. L.D. Marks, P. Xu, D.N. Dunn, and J.P. Zhang: Atomic imaging of surfaces in plan view. EMSA 22, 65 (1992).
29. P. Xu, D. Dunn, J.P. Zhang, and L.D. Marks: Atomic imaging of surfaces in plan view. Surf Sci. Lett. 285, L479 (1993).
30. P. Xu and L.D. Marks: Intensities of surface diffraction spots in plan view. Ultramicroscopy 45, 155 (1992).
31. C. Giacovazzo: Direct Phasing in Crystallography: Fundamentals and Applications (Oxford Unversity Press, New York, 1998).
32. E. Bengu, R. Plass, L.D. Marks, T. Ichihashi, P.M. Ajayan, and S. Iijima: Imaging the dimers on Si(111)-7 × 7. Phys. Rev. Lett. 77, 4226 (1996).
33. L.D. Marks: Direct imaging of carbon-covered and clean gold (110) surfaces. Phys. Rev. Lett. 51, 1000 (1983).
34. L.D. Marks and D.J. Smith: Direct surface imaging in small metal particles. Nature 303, 316 (1983).
35. P. Lu and D.J. Smith: Direct imaging of CdTe(001) surface reconstructions by high resolution electron microscopy. Surf Sci. 254, 119 (1991).
36. T. Mishima and T. Osaka: Profile imaging of the InSb{111}A,B-(2 × 2) surfaces. Surf Sci. 395, L256 (1998).
37. 8. J. Solid State Chem. 149, 327 (2000).
38. L.D. Marks: Direct imaging of solid surfaces. I. Image simulation and interpretation. Surf Sci. 139, 281 (1984).
39. D.N. Dunn, R. Ai, T.S. Savage, J.P. Zhang, and L.D. Marks: Preparation and detection of reconstructed plan-view surfaces. Ultramicroscopy 38, 333 (1991).
40. L.D. Marks: Rigor, and plan-view simulation of surfaces. Ultramicroscopy 38, 325 (1991).
41. L.D. Marks: Wiener-filter enhancement of noisy HREM images. Ultramicroscopy 62, 43 (1996).
42. E. Bengu: Experimental & computational study of surfaces, interfaces, and thin films, in Materials Science and Engineering (Northwestern University, Evanston, IL, 2000), p. 233.
43. L.D. Marks, N. Erdman, and A. Subramanian: Crystallographic direct methods for surfaces. J. Phys.: Condens. Matter 13, 10677 (2001).
44. D. Grozea, E. Landree, C. Collazo-Davila, E. Bengu, R. Plass, and L.D. Marks: Structural investigations of metal-semiconductor surfaces. Micron 30, 41 (1999).
45. 2-rich reconstruction with a c(4 × 2) unit cell. J. Am. Chem. Soc. 125, 10050 (2003).