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Volumn 74, Issue 10, 2003, Pages 4462-4467
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Inelastic electron tunneling spectrometer to characterize metal-oxide-semiconductor devices with ultrathin oxides
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ELECTRIC CONDUCTANCE;
ELECTRON TUNNELING;
OXIDES;
SIGNAL TO NOISE RATIO;
SILICON;
SPECTROMETERS;
VIBRATIONAL MODES;
MOS DEVICES;
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EID: 0142167383
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1611995 Document Type: Article |
Times cited : (22)
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References (22)
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