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Volumn 74, Issue 10, 2003, Pages 4462-4467

Inelastic electron tunneling spectrometer to characterize metal-oxide-semiconductor devices with ultrathin oxides

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ELECTRIC CONDUCTANCE; ELECTRON TUNNELING; OXIDES; SIGNAL TO NOISE RATIO; SILICON; SPECTROMETERS;

EID: 0142167383     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1611995     Document Type: Article
Times cited : (22)

References (22)
  • 2
    • 0003552479 scopus 로고
    • edited by P. K. Hansma (Plenum, New York)
    • P. K. Hansma, Tunneling Spectroscopy, edited by P. K. Hansma (Plenum, New York, 1982).
    • (1982) Tunneling Spectroscopy
    • Hansma, P.K.1
  • 4
    • 0142193127 scopus 로고
    • Ph.D. thesis, Yale University
    • I. Bencuya, Ph.D. thesis, Yale University, 1984.
    • (1984)
    • Bencuya, I.1
  • 13
    • 0142255310 scopus 로고    scopus 로고
    • National Instruments, Austin, TX 78759-3504
    • National Instruments, Austin, TX 78759-3504.
  • 16
    • 0142224254 scopus 로고    scopus 로고
    • Lake Shore Cryotronics, Westerville, OH. 43082-9803
    • Lake Shore Cryotronics, Westerville, OH. 43082-9803.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.