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Volumn 104, Issue 6, 2008, Pages

Experimental off-axis electron holography of focused ion beam-prepared Si p-n junctions with different dopant concentrations

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[No Author keywords available]

Indexed keywords


EID: 54749105097     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2982415     Document Type: Article
Times cited : (35)

References (14)
  • 1
    • 0004245602 scopus 로고    scopus 로고
    • 2005 ed. (Semiconductor Industry Association, San Jose, CA); See for details.
    • International Technology Roadmap for Semiconductors, 2005 ed. (Semiconductor Industry Association, San Jose, CA, 2005); See http://public.itrs.net for details.
    • (2005) International Technology Roadmap for Semiconductors


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.