-
1
-
-
0032620923
-
-
W. D. Rau, P. Schwander, F. H. Baumann, W. Hoppner, and A. Ourmazd, Phys. Rev. Lett. 82, 2614 (1999).
-
(1999)
Phys. Rev. Lett.
, vol.82
, pp. 2614
-
-
Rau, W.D.1
Schwander, P.2
Baumann, F.H.3
Hoppner, W.4
Ourmazd, A.5
-
2
-
-
49149118330
-
-
See for International Technology Roadmafor Semiconductors, 2007 edition. (Semiconductor Industry Association, San Jose, CA, 2005).
-
See http://public.itrs.net for International Technology Roadmap for Semiconductors, 2007 edition. (Semiconductor Industry Association, San Jose, CA, 2005).
-
-
-
-
3
-
-
2942604212
-
-
A. C. Twitchett, R. E. Dunin-Borkowski, R. E. Hallifax, R. F. Broom, and P. A. Midgley, J. Microsc., 214, 287 (2004).
-
(2004)
J. Microsc.
, vol.214
, pp. 287
-
-
Twitchett, A.C.1
Dunin-Borkowski, R.E.2
Hallifax, R.E.3
Broom, R.F.4
Midgley, P.A.5
-
4
-
-
32444434282
-
-
D. Cooper, A. C. Twitchett, P. K. Somodi, I. Farrer, D. A. Ritchie, P. A. Midgley, and R. E. Dunin-Borkowski, Appl. Phys. Lett. 88, 063510 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 063510
-
-
Cooper, D.1
Twitchett, A.C.2
Somodi, P.K.3
Farrer, I.4
Ritchie, D.A.5
Midgley, P.A.6
Dunin-Borkowski, R.E.7
-
5
-
-
49149118614
-
-
J. Appl. Phys. (in press).
-
D. Cooper, C. Ailliot, R. Truche, J. Hartmann, J. Barnes, and F. Bertin, " Experimental off-axis electron holography of FIB-prepared Si p-n junctions with different dopant concentrations.," J. Appl. Phys. (in press).
-
Experimental Off-axis Electron Holography of FIB-prepared Si P-n Junctions with Different Dopant Concentrations
-
-
Cooper, D.1
Ailliot, C.2
Truche, R.3
Hartmann, J.4
Barnes, J.5
Bertin, F.6
-
7
-
-
33845659565
-
-
K. Thompson, D. Lawrence, D. J. Larsson, J. D. Olson, T. F. Kelly, and B. Gorman, Ultramicroscopy 107, 131 (2007).
-
(2007)
Ultramicroscopy
, vol.107
, pp. 131
-
-
Thompson, K.1
Lawrence, D.2
Larsson, D.J.3
Olson, J.D.4
Kelly, T.F.5
Gorman, B.6
-
8
-
-
49149095681
-
-
MRS Symposia Proceeding No. 199, edited by R. Anderson (Materials Research Society, Pittsburgh)
-
K. H. Park, Workshop on Specimen Preparation for BM of Materials, MRS Symposia Proceeding No. 199, edited by, R. Anderson, (Materials Research Society, Pittsburgh, 1990), pp. 271-274.
-
(1990)
Workshop on Specimen Preparation for BM of Materials
, pp. 271-274
-
-
Park, K.H.1
-
9
-
-
34948861805
-
-
D. Cooper, R. Truche, P. Rivallin, J. Hartmann, F. Laugier, F. Bertin, and A. Chabli, Appl. Phys. Lett. 91, 143501 (2007).
-
(2007)
Appl. Phys. Lett.
, vol.91
, pp. 143501
-
-
Cooper, D.1
Truche, R.2
Rivallin, P.3
Hartmann, J.4
Laugier, F.5
Bertin, F.6
Chabli, A.7
-
10
-
-
49149098844
-
-
see for The Stopping and Range of Ions in Matter.
-
J. F. Zeigler, see www.srim.org for The Stopping and Range of Ions in Matter, 2003.
-
(2003)
-
-
Zeigler, J.F.1
-
11
-
-
0037043008
-
-
M. A. Gribelyuk, M. R. McCartney, J. Li, C. S. Murthy, and P. Ronsheim, Phys. Rev. Lett. 89, 025502 (2002).
-
(2002)
Phys. Rev. Lett.
, vol.89
, pp. 025502
-
-
Gribelyuk, M.A.1
McCartney, M.R.2
Li, J.3
Murthy, C.S.4
Ronsheim, P.5
-
12
-
-
36849066232
-
-
M. G. Han, P. Fejes, Q. Xie, S. Bagchi, B. Taylor, J. Connor, and M. R. McCartney, IEEE Trans. Electron Devices 54, 3336 (2007).
-
(2007)
IEEE Trans. Electron Devices
, vol.54
, pp. 3336
-
-
Han, M.G.1
Fejes, P.2
Xie, Q.3
Bagchi, S.4
Taylor, B.5
Connor, J.6
McCartney, M.R.7
-
13
-
-
49149095943
-
-
in Proceedings of Sixteenth International Microscopy Congress, Sapporo, Japan, 3-8 September.
-
P. Formanek, in Proceedings of Sixteenth International Microscopy Congress, Sapporo, Japan, 3-8 September 2006.
-
(2006)
-
-
Formanek, P.1
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