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Volumn 101, Issue 9, 2007, Pages

The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON HOLOGRAPHY; ELECTRON IRRADIATION; FOCUSED ION BEAMS; SEMICONDUCTING GALLIUM ARSENIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 34248587479     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2730557     Document Type: Conference Paper
Times cited : (35)

References (18)
  • 2
    • 0035239178 scopus 로고    scopus 로고
    • 0968-4328 10.1016/S0968-4328(99)00105-5
    • P. A. Midgley, Micron 0968-4328 10.1016/S0968-4328(99)00105-5 32, 167 (2001).
    • (2001) Micron , vol.32 , pp. 167
    • Midgley P., A.1
  • 5
    • 11244300749 scopus 로고    scopus 로고
    • 0163-1829 10.1103/PhysRevB.70.165313
    • L. Houben, M. Luysberg, and T. Brammer, Phys. Rev. B 0163-1829 10.1103/PhysRevB.70.165313 70, 165313 (2004).
    • (2004) Phys. Rev. B , vol.70 , pp. 165313
    • Houben, L.1    Luysberg, M.2    Brammer, T.3
  • 10
    • 21544461147 scopus 로고
    • 0022-3719 10.1088/0022-3719/18/20/012
    • D. Pons and J. C. Bourgoin, J. Phys. C 0022-3719 10.1088/0022-3719/18/20/ 012 18, 3839 (1985).
    • (1985) J. Phys. C , vol.18 , pp. 3839
    • Pons, D.1    Bourgoin J., C.2
  • 18
    • 34248588637 scopus 로고    scopus 로고
    • D. Cooper (unpublished, 2006).
    • (2006)
    • Cooper, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.