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Volumn 101, Issue 9, 2007, Pages
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The influence of electron irradiation on electron holography of focused ion beam milled GaAs p-n junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON HOLOGRAPHY;
ELECTRON IRRADIATION;
FOCUSED ION BEAMS;
SEMICONDUCTING GALLIUM ARSENIDE;
TRANSMISSION ELECTRON MICROSCOPY;
ELECTRICAL CONNECTIONS;
PHASE IMAGES;
TRANSMISSION ELECTRON MICROSCOPES;
SEMICONDUCTOR JUNCTIONS;
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EID: 34248587479
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2730557 Document Type: Conference Paper |
Times cited : (35)
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References (18)
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