Conductivity measurements of stilbene-based molecules incorporated into self-assembled monolayers by conducting probe atomic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 7 B, 2004, Pages 4511-4516

  Azehara, Hiroaki ^a,c   Liang, Tien Tzu ^a,b   Ishida, Takao ^a   Naitoh, Yasuhisa ^a   Mizutani, Wataru ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NEW ENERGY AND INDUSTRIAL TECHNOLOGY DEVELOPMENT ORGANIZATION   (Japan)

^c HOKKAIDO UNIVERSITY   (Japan)

Author keywords

4,4 bis(mercaptomethyl) trans stilbene; Conducting probe atomic force microscopy; Current imaging tunneling spectroscopy; Point contact current imaging atomic force microscopy; Self assembled monolayer

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; IMAGING TECHNIQUES; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; NATURAL FREQUENCIES; SURFACE TOPOGRAPHY;

4,4'0BIS(MERCAPTOMETHYL)-TRANS-STILBENE; CONDUCTING PROBE ATOMIC FORCE MICROSCOPY; CURRENT IMAGING TUNNELING SPECTROSCOPY; POINT-CONTACT CURRENT-IMAGING ATOMIC FORCE MICROSCOPY;

SELF ASSEMBLY;

EID: 5444243889     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.4511     Document Type: Conference Paper

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