Au nanocrystal flash memory reliability and failure analysis

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2008, Pages

  Singh, Pawan K ^a,b   Singh, Kaushal K ^b   Hofmann, Ralf ^b   Armstrong, Karl ^b   Krishna, Nety ^b   Mahapatra, Souvik ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^b APPLIED MATERIALS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; ELECTRIC NETWORK ANALYSIS; ELECTRONICS INDUSTRY; FAILURE ANALYSIS; FLASH MEMORY; INTEGRATED CIRCUITS; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURES; NANOTECHNOLOGY; PLATINUM; QUALITY ASSURANCE; RELIABILITY ANALYSIS; SAFETY FACTOR; SEMICONDUCTOR STORAGE; TECHNICAL PRESENTATIONS;

ELECTRICAL CHARACTERIZATIONS; ELECTRICAL METHODS; FORMATION PROCESSES; INTERNATIONAL SYMPOSIUM; MEMORY PERFORMANCE; NANOCRYSTAL FLASH MEMORY; NANOCRYSTAL MEMORY DEVICES; POOR PERFORMANCE; TEST WAFERS;

RELIABILITY;

EID: 51949105743     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2008.4588190     Document Type: Conference Paper

References (12)

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