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Volumn 25, Issue 7, 2008, Pages 1661-1667

Recognition of diffraction-grating profile using a neural network classifier in optical scatterometry

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION (OF INFORMATION); CLASSIFIERS; DIFFRACTION; IMAGE CLASSIFICATION; INVERSE PROBLEMS; LEARNING SYSTEMS; PHOTORESISTS; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON COMPOUNDS;

EID: 51849147610     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.25.001661     Document Type: Article
Times cited : (23)

References (24)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.