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Volumn 41, Issue 34, 2002, Pages 7187-7192

Phase-modulation scatterometry

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC ANALYSIS; PHASE MODULATION; PHOTODETECTORS; REFLECTION; SENSITIVITY ANALYSIS;

EID: 0036905699     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.007187     Document Type: Article
Times cited : (21)

References (14)
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    • Ellipsometric scatterometry for the metrology of sub-0.1-rm-linewidth structures
    • B. K. Minhas, S. A. Coulombe, S. S. H. Naqvi, and J. R. McNeil, “Ellipsometric scatterometry for the metrology of sub-0.1-rm-linewidth structures,” Appl. Opt. 37, 5112-5115 (1998).
    • (1998) Appl. Opt. , vol.37 , pp. 5112-5115
    • Minhas, B.K.1    Coulombe, S.A.2    Naqvi, S.S.H.3    Mc Neil, J.R.4
  • 5
    • 0003928017 scopus 로고    scopus 로고
    • Ph.D. dissertation (University of New Mexico, Albuquerque, N. Mex
    • P. C. Logofatu, Sensitivity Optimized Scatterometry, Ph.D. dissertation (University of New Mexico, Albuquerque, N. Mex., 2000).
    • (2000) Sensitivity Optimized Scatterometry
    • Logofatu, P.C.1
  • 6
    • 0036901883 scopus 로고    scopus 로고
    • Sensitivity analysis of grating parameter estimation
    • P. C. Logofatu, “Sensitivity analysis of grating parameter estimation,” Appl. Opt. 41, 7179-7186 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 7179-7186
    • Logofatu, P.C.1
  • 7
    • 36849101400 scopus 로고
    • An improved method for high reflectivity ellipsometry based on a new polarization modulation technique
    • S. N. Jasperson and S. E. Schnatterly, “An improved method for high reflectivity ellipsometry based on a new polarization modulation technique,” Rev. Sci. Instrum. 40, 761-767 (1969).
    • (1969) Rev. Sci. Instrum. , vol.40 , pp. 761-767
    • Jasperson, S.N.1    Schnatterly, S.E.2
  • 8
    • 0001852936 scopus 로고
    • Improvements of phase modulated ellipsometry
    • O. Acher, E. Bigan, and B. Drevillon, “Improvements of phase modulated ellipsometry,” Rev. Sci. Instrum. 60, 65-77 (1989).
    • (1989) Rev. Sci. Instrum. , vol.60 , pp. 65-77
    • Acher, O.1    Bigan, E.2    Drevillon, B.3
  • 10
    • 0029307028 scopus 로고
    • Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings
    • M. G. Moharram, E. B. Grann, and D. A. Pommet, “Formulation for stable and efficient implementation of the rigorous coupled-wave analysis of binary gratings,” J. Opt. Soc. Am. A 12, 1068-1076 (1995).
    • (1995) J. Opt. Soc. Am. A , vol.12 , pp. 1068-1076
    • Moharram, M.G.1    Grann, E.B.2    Pommet, D.A.3
  • 11
    • 0029306568 scopus 로고
    • Stable implementation of the rigorous coupled-wave theory for surface-relief gratings: Enhanced transmittance matrix approach
    • M. G. Moharram, D. A. Pommet, and E. B. Grann, “Stable implementation of the rigorous coupled-wave theory for surface-relief gratings: enhanced transmittance matrix approach,” J. Opt. Soc. Am. A 12, 1077-1086 (1995).
    • (1995) J. Opt. Soc. Am. A , vol.12 , pp. 1077-1086
    • Moharram, M.G.1    Pommet, D.A.2    Grann, E.B.3
  • 12
    • 0029314080 scopus 로고
    • Modulated interference effects: Use of photoelastic modulators with lasers
    • T. C. Oakberg, “Modulated interference effects: use of photoelastic modulators with lasers,” Opt. Eng. 34, 1545-1550 (1995).
    • (1995) Opt. Eng. , vol.34 , pp. 1545-1550
    • Oakberg, T.C.1
  • 13
    • 0000951093 scopus 로고
    • Generalized ellipsometry for surfaces with directional preference: Application to diffraction gratings
    • R. M. A. Azzam and N. M. Bashara, “Generalized ellipsometry for surfaces with directional preference: Application to diffraction gratings,” J. Opt. Soc. Am. 62, 1521-1523 (1972).
    • (1972) J. Opt. Soc. Am. , vol.62 , pp. 1521-1523
    • Azzam, R.M.A.1    Bashara, N.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.