Full-chip leakage analysis in nano-scale technologies: Mechanisms, variation sources, and verification

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 594-599

  Li, Tao ^a   Zhang, Wenjun ^a   Yu, Zhiping ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Leakage modeling; Statistical analysis; Variation source

Indexed keywords

ALGEBRA; APPROXIMATION ALGORITHMS; BOOLEAN FUNCTIONS; COMPUTER AIDED DESIGN; DIGITAL INTEGRATED CIRCUITS; INDUSTRIAL ENGINEERING; MATHEMATICAL MODELS; MONTE CARLO METHODS; NANOELECTRONICS; TRELLIS CODES;

FULL-CHIP LEAKAGE; LEAKAGE MODELING; STATISTICAL ANALYSIS; VARIATION SOURCE;

LEAKAGE CURRENTS;

EID: 51549119104     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555887     Document Type: Conference Paper

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