Statistical analysis of full-chip leakage power considering junction tunneling leakage

Proceedings - Design Automation Conference

Volumn , Issue , 2007, Pages 99-102

  Li, Tao ^a   Yu, Zhiping ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Gaussian and non Gaussian parameter distributions; Junction tunneling leakage; Statistical analysis

Indexed keywords

ALGORITHMS; ELECTRON TUNNELING; GAUSSIAN DISTRIBUTION; OXIDES; STATISTICAL METHODS; THRESHOLD CURRENT DENSITY;

FULL-CHIP LEAKAGE POWER; GATE OXIDE LEAKAGE; JUNCTION TUNNELING LEAKAGE; SPATIAL CORRELATIONS;

LEAKAGE CURRENTS;

EID: 34547319657     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2007.375132     Document Type: Conference Paper

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