Mixed loopback BiST for RF digital transceivers

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2004, Pages 220-228

  Da̧browski, Jerzy ^a   Bayon, Javier Gonzalez ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONAL LEVELS; SIGNAL POWER; SPOT DEFECTS; TEST RESPONSE;

BUILT-IN SELF TEST; COMPUTER SIMULATION; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE;

TRANSCEIVERS;

EID: 24944547647     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2004.1347843     Document Type: Conference Paper

References (13)

1. A.Grochowski, et al, "Integrated Circuits Testing for Quality Assurance in Manufacturing: History", IEEE Trans.CAS-II: Analog and Digital Signal Proc., Vol.44, No.8, Aug.1997, pp. 610-633
2. M.Soma, "Challenges and Approaches in Mixed Signal RF Testing", Proc. ASIC Conf, 1997, pp.33-37
3. M.Heutmaker, D.Le, "An Architecture for Self-Test of a Wireless Communication System Using Sampled IQ Modulation and Boundary Scan", IEEE Communication Mag., June, 1999, pp.98-102
4. J.Dabrowski, "BiST Model for IC RF-Transceiver Front-End", Proc. of DFT'03, pp. 295-302
5. S.Ozev, C.Olgaard, "Wafer-level RF Test and DfT for VCO Modulating Architectures", Proc. VTS' 04, 6 pp.
6. G. Srinivasan et al, "Loopback Test of RF Transceivers Using Periodic Bit Sequences", IMSTW'04, 6 pp.
7. M.Sachdev, B. Atzema, "Industrial Relevance of Analog IFA: A Fact or a Fiction", Proc.ITC'95, pp.61-70
8. M.J.Ohletz, "Realistic Fault Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits", Proc. ITC'96, pp.776-785
9. Y.Xing, "Defect-Oriented Testing of Mixed-Signal ICs", Proc.ITC'98, pp.678-687
10. J.Dabrowski, "Fault Modeling of RF Blocks Based on Noise Analysis", Proc. of ISCAS'04, 4 pp.
11. J.Dabrowski, L.Li, "Signal Path Sensitization for Built-in-Self-Test in Integrated RF Transceivers", Proc. DDECS'04, pp.59-66.
12. (_) "Using Error Vector Magnitude Measurements ", Agilent PN 89400-14
13. S.Haykin, "Digital Communications", Wiley, 1988