Multi-output one-digitizer measurement

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 258-264

  Sasho, S ^a   Shibata, M ^a  

^a Asahi Kasei Microsystems Co   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; MIXER CIRCUITS;

MIXED-SIGNAL TESTERS; PARALLEL TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0032315251     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)