Spectral prediction for specification-based loopback test of embedded mixed-signal circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn 2006, Issue , 2006, Pages 6-11

  Shin, Hongjoong ^a   Kim, Byoungho ^a   Abraham, Jacob A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MASKS; MIXER CIRCUITS; PARAMETER ESTIMATION; REGRESSION ANALYSIS;

FAULT MASKING; MIXED SIGNAL CIRCUITS; TEST ACCURACY; TEST SOLUTION;

INTEGRATED CIRCUIT TESTING;

EID: 33751097782     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2006.83     Document Type: Conference Paper

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