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Volumn , Issue , 2007, Pages 297-302

Novel cross-loopback based test approach for specification test of multi-band, multi-hardware radios

Author keywords

[No Author keywords available]

Indexed keywords

COMMUNICATION STANDARDS; CROSS-LOOPBACK TESTING; MULTI-HARDWARE RADIOS; SPECIFICATION TESTS;

EID: 37549033915     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2007.43     Document Type: Conference Paper
Times cited : (5)

References (15)
  • 2
    • 0033079231 scopus 로고    scopus 로고
    • Broadband RF Stage Architecture for Software Defined Radio in Handheld Terminal Applications
    • February
    • H. Turumi and Y. Suzuki, "Broadband RF Stage Architecture for Software Defined Radio in Handheld Terminal Applications," IEEE Communications Magazine, February 1999, pp. 90-95.
    • (1999) IEEE Communications Magazine , pp. 90-95
    • Turumi, H.1    Suzuki, Y.2
  • 4
    • 37549029584 scopus 로고    scopus 로고
    • Fully Integrated CMOS Radios from RF to Millimeter Wave Frequencies, Intel Technology Journal, Vol. 8, Issue 3
    • August
    • Luiz M. Franca-Neto, R. Eline, B. Balvinder, "Fully Integrated CMOS Radios from RF to Millimeter Wave Frequencies," Intel Technology Journal, Vol. 8, Issue 3, ISSN 1535-864X, August 2004, pp. 241-258.
    • (2004) ISSN , vol.1535-864X , pp. 241-258
    • Luiz, M.1    Franca-Neto, R.2
  • 5
    • 0036056699 scopus 로고    scopus 로고
    • Life is CMOS: Why chase the life after?
    • G. Sery, S. Borkar, and V. De, "Life is CMOS: Why chase the life after?," Proc. DAC, 2002, pp. 78-83.
    • (2002) Proc. DAC , pp. 78-83
    • Sery, G.1    Borkar, S.2    De, V.3
  • 7
    • 17444390880 scopus 로고    scopus 로고
    • Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of Systems Specifications
    • Bhattacharya, S., Haider, A., Srinivasan, G. and Chatterjee, A., "Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of Systems Specifications," Journal of Electronic Testing: Theory and Applications, Vol. 21, No. 3, pp. 323-339. 2005.
    • (2005) Journal of Electronic Testing: Theory and Applications , vol.21 , Issue.3 , pp. 323-339
    • Bhattacharya, S.1    Haider, A.2    Srinivasan, G.3    Chatterjee, A.4
  • 9
    • 33751116117 scopus 로고    scopus 로고
    • A.Chatterjee, F.Taenzler, Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral
    • G.Srinivasan, A.Chatterjee, F.Taenzler, "Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures ,Proc, VTS 2006 : 222-227
    • Signatures ,Proc , vol.VTS 2006 , pp. 222-227
    • Srinivasan, G.1
  • 13
    • 0002432565 scopus 로고
    • Multivariate adaptive regression splines
    • J.H Friedman, "Multivariate adaptive regression splines," The Annals of statistics, vol 19,no.1.pp.1-141, 1991.
    • (1991) The Annals of statistics , vol.19 , Issue.1 , pp. 1-141
    • Friedman, J.H.1
  • 14
    • 0142215980 scopus 로고    scopus 로고
    • Automatic Mulûtone Alternate Test Generation For RF Circuits Using Behavioral Models
    • A Halder, S. Bhattacharya and A Chatterjee, "Automatic Mulûtone Alternate Test Generation For RF Circuits Using Behavioral Models", Proc. Intl. Test Conf. 2003, pp. 665-573.
    • (2003) Proc. Intl. Test Conf , pp. 665-573
    • Halder, A.1    Bhattacharya, S.2    Chatterjee, A.3
  • 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.