A tutorial introduction to research on analog and mixed-signal circuit testing

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing

Volumn 45, Issue 10, 1998, Pages 1389-1407

  Milor, Linda S ^a,b  

^a IEEE   (United States)

^b Submicron Development Cent   (United States)

Author keywords

Analog circuits; Analog system fault diagnosis; Analog system testing; Built in testing; Integrated circuit testing; Mixed analog digital integrated circuits; Testing

Indexed keywords

COMPUTER SIMULATION; DIGITAL INTEGRATED CIRCUITS; LINEAR INTEGRATED CIRCUITS;

BUILT-IN-SELF-TEST (BIST) CIRCUITRY; MIXED-SIGNAL CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0032183635     PISSN: 10577130     EISSN: None     Source Type: Journal    
DOI: 10.1109/82.728852     Document Type: Article

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