Transformer-coupled loopback test for differential mixed-signal specifications

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2007, Pages 291-296

  Kim, Byoungho ^a   Fu, Zhenhai ^b   Abraham, Jacob A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE UNDER TEST (DUT); DYNAMIC PERFORMANCE; MIXED-SIGNAL SPECIFICATIONS; RADIO-FREQUENCY (RF) TRANSFORMERS;

DYNAMICAL SYSTEMS; ELECTRIC TRANSFORMERS; PARAMETER ESTIMATION; PROBLEM SOLVING; SPECIFICATIONS;

ELECTRONIC EQUIPMENT TESTING;

EID: 37549014202     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2007.82     Document Type: Conference Paper

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