Characterization of adsorbed protein films using time-of-flight-secondary ion mass spectrometry and multivariate analysis

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 698-703

  Wagner, M S ^a   Castner, David G ^a,b  

^a University of Washington   (United States)

^b University of Washington   (United States)

Author keywords

Adsorbed proteins; Linear discriminant analysis; Multivariate analysis; Principal component analysis; ToF SIMS

Indexed keywords

ADSORPTION; DATA REDUCTION; PATTERN RECOGNITION; PRINCIPAL COMPONENT ANALYSIS; PROTEINS; SECONDARY ION MASS SPECTROMETRY;

PROTEIN FILMS;

SURFACE PROPERTIES;

EID: 0037437880     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00794-8     Document Type: Conference Paper

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